Materials (Bulk): Damage, Tracks - Part IV
Wednesday, July 4, 2018
T02. Materials (Bulk): Damage, Tracks
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T02.4
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9:00 AM
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9:40 AM
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Materials (Bulk): Damage, Tracks - Part IV
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Campus 1 // AMPHI 2000
T02. Materials (Bulk): Damage, Tracks
9:00 AM
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T02.4-O1-187
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Morphology of etched ion tracks in SiO2: dependence on ion energy and etching parameters
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A.
Andrea
HADLEY
9:20 AM
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T02.4-O2-91
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Helium in swift heavy ion irradiated ODS alloys
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V.
Vladimir
Skuratov
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